David Lewis

MicroLED Cost Reduction: Enabling Higher Yields with High Throughout Inspection

MicroLED continues to be a tantalizing option for display manufacturers, due to the many advantages and consumer applications that MicroLED offers (e.g., AR/VR, smart watches, automotive displays, TVs, etc.). However, display manufacturers are still facing several fundamental problems in testing and inspection. InZiv CEO David Lewis will present some of the critical challenges in MicroLED inspection that are leading to low yields and high costs. He will then provide an overview of InZiv’s technological breakthrough in MicroLED inspection and how such a solution can
dramatically improve yields and lower costs across the industry, enabling mass production of MicroLED displays at affordable consumer price points.

David Lewis is Founder and CEO of InZiv. David is an expert in microLED metrology and inspection, nano-technology, and nano-optical tools, with nearly two decades of experience in managing complex sales to world-leading companies and institutions. He holds multiple patents and has published multiple peer-reviewed papers in the field of nano-optics and nano-technology. David received his MSc. in Physical Chemistry from The Hebrew University of Jerusalem.